High-quality testing is often supported by comprehensive cloud-based and automated platforms: The Importance of Software Testing - IEEE Computer Society
Emerging 3D and nanometer systems increasingly rely on BIST architectures, which allow chips to test themselves, reducing the need for expensive external automatic test equipment (ATE). The 2026 Testing Landscape The industry is currently facing a shift toward Autonomous Quality Engineering Digital Systems Testing and Testable Design | PDF - Scribd | Fault Model | Description | Coverage Target
Modern DFT integrates test compression to reduce data volume. A decompressor expands a small number of input channels into many internal scan chains, while a compactor reduces output pins. | Critical for high-speed designs | | Bridging
| Fault Model | Description | Coverage Target | | :--- | :--- | :--- | | | Node permanently tied to 0 or 1. | >99% (industry standard) | | Transition Delay | Signal fails to propagate within clock period (slow-to-rise/fall). | >95% for timing-critical paths | | Path Delay | Cumulative delay along a specific path exceeds limit. | Critical for high-speed designs | | Bridging (Wired-AND/OR) | Two nets shorted together. | Requires IDDQ or specialized ATPG | | Open (Stuck-open) | Transistor gate disconnected (sequential behavior). | Hard; needs two-pattern tests | needs two-pattern tests |